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2013-06-28 - EFM32G230FXX - d0005_Rev1.60
36
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Symbol
Parameter
Condition
Min
Typ
Max
Unit
200 kSamples/s, 12 bit, differ-
ential, VDD reference
79
dBc
200 kSamples/s, 12 bit, differ-
ential, 2xVDD reference
79
dBc
After calibration, single ended
0.3
mV
VADCOFFSET
Offset voltage
After calibration, differential
0.3
mV
-1.92
mV/°C
TGRADADCTH
Thermometer output gradi-
ent
-6.3
ADC
Codes/
°C
DNLADC
Differential non-linearity
(DNL)
±0.7
LSB
INLADC
Integral non-linearity (INL),
End point method
±1.2
LSB
MCADC
No missing codes
11.999
1
12
bits
1On the average every ADC will have one missing code, most likely to appear around 2048 +/- n*512 where n can be a value in
the set {-3, -2, -1, 1, 2, 3}. There will be no missing code around 2048, and in spite of the missing code the ADC will be monotonic
at all times so that a response to a slowly increasing input will always be a slowly increasing output. Around the one code that is
missing, the neighbour codes will look wider in the DNL plot. The spectra will show spurs on the level of -78dBc for a full scale
input for chips that have the missing code issue.
The integral non-linearity (INL) and differential non-linearity parameters are explained in
Figure 3.25 (p.Figure 3.25. Integral Non-Linearity (INL)
Ideal t ransfer
curve
Digit al ouput code
Analog Input
INL= |[ (VD-VSS)/VLSBIDEAL] - D| where 0 < D < 2
N - 1
0
1
2
3
4092
4093
4094
4095
VOFFSET
Act ual ADC
t ranfer funct ion
before offset and
gain correct ion
Act ual ADC
t ranfer funct ion
aft er offset and
gain correct ion
INL Error
(End Point INL)